2-Phenylimidazole Corrosion Inhibitor on Copper: An XPS and ToF-SIMS Surface Analytical Study

This work presents a surface analytical study of the corrosion inhibitor 2-phenylimidazole (2PhI) adsorbed on Cu from 3 wt.% NaCl solution. X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary ion mass spectrometry (ToF-SIMS) were used to investigate phenomena. Various XPS experiments performed, i.e., survey- angle-resolved high-resolution spectra measurements, gas cluster beam sputtering in conjunction with imaging principal component analysis. These measurements detail composition layer at depth. In addition, various ToF-SIMS such as positive spectral imaging, cooling/heating measurements. shows that organometallic complexes formed between 2PhI molecules ions, contained entrapped NaCl, some Cu(II) species (but majority Cu(I)-containing species), was almost completely covered combination complex, temperature stability these increases when is included complex.